8 Commits

Include renames

Author	SHA1	Message	Date
J. Nick Koston	d1e737280f	Fix ESP8266 SPI test pin conflict: use GPIO0 for interrupt_pin	2026-04-04 09:18:04 -10:00
J. Nick Koston	41e09c1e6c	[mcp23xxx][pi4ioe5v6408] Add optional interrupt pin to eliminate polling ... Extend interrupt_pin support to MCP23008, MCP23017, MCP23S08, MCP23S17, and PI4IOE5V6408 GPIO expander components. Same approach as PCF8574/PCA9554: when configured, the component disables its loop and only wakes on interrupt, and the cache stays valid between interrupts so binary sensors return from cache instead of doing I2C/SPI reads every loop iteration. For MCP23xxx, the interrupt_pin config and C++ logic lives in the shared MCP23XXXBase template class, so all four variants (I2C 8/16-pin, SPI 8/16-pin) inherit it automatically. Inspired by jesserockz's work in #11959 which proposed a more comprehensive interrupt-driven approach with per-pin interrupt status register reading. This implementation takes a simpler path by leveraging the existing CachedGpioExpander cache invalidation mechanism.	2026-04-04 09:12:09 -10:00
J. Nick Koston	d0b399d771	[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)	2025-11-07 15:44:01 +13:00
J. Nick Koston	dcf2697a2a	Group component tests to reduce CI time (#11134)	2025-10-12 07:21:45 +13:00
J. Nick Koston	56334b7832	[ci][tests] Remove redundant ESP32 Arduino test files (#11136)	2025-10-10 07:26:41 +13:00
Keith Burzinski	4e4566361f	[CI] Consolidate some tests (M) (#8202)	2025-02-05 12:05:59 +13:00
Keith Burzinski	f6848fe24d	[CI] Introduce testing for IDF 5 (and other arbitrary framework versions) (#6802) ... * Initial changes to support testing of additional framework versions * Rename Arduino test files	2024-06-17 16:32:11 -05:00
Keith Burzinski	2b215fecc9	Add some components to the new testing framework (M part 1) (#6207)	2024-04-23 15:45:12 +12:00