Group component tests to reduce CI time (#11134)

2026-09-26 14:30:23 +00:00 · 2025-10-12 07:21:45 +13:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
@@ -1,9 +1,5 @@
-i2c:
-  - id: i2c_bme680
-    scl: ${scl_pin}
-    sda: ${sda_pin}
-
 bme680_bsec:
+  i2c_id: i2c_bus
  address: 0x77

 sensor:
@@ -1,5 +1,4 @@
-substitutions:
-  scl_pin: GPIO22
-  sda_pin: GPIO21
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-ard.yaml

 <<: !include common.yaml
@@ -1,5 +1,4 @@
-substitutions:
-  scl_pin: GPIO5
-  sda_pin: GPIO4
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp8266-ard.yaml

 <<: !include common.yaml