Group component tests to reduce CI time (#11134)

This commit is contained in:
J. Nick Koston
2025-10-12 07:21:45 +13:00
committed by GitHub
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
+1 -5
View File
@@ -1,10 +1,6 @@
i2c:
- id: i2c_bme680
scl: ${scl_pin}
sda: ${sda_pin}
sensor:
- platform: bme680
i2c_id: i2c_bus
temperature:
name: BME680 Temperature
oversampling: 16x