[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)

This commit is contained in:
J. Nick Koston
2025-11-12 16:44:19 +13:00
committed by GitHub
parent 56d141c741
commit 398dba4fc8
21 changed files with 0 additions and 182 deletions
@@ -1,48 +0,0 @@
<<: !include ../logger/common-usb_serial_jtag.yaml
esphome:
on_boot:
then:
- uart.write:
id: uart_1
data: 'Hello World'
- uart.write:
id: uart_1
data: [0x00, 0x20, 0x42]
uart:
- id: uart_1
tx_pin: 4
rx_pin: 5
flow_control_pin: 6
baud_rate: 9600
data_bits: 8
rx_buffer_size: 512
rx_full_threshold: 10
rx_timeout: 1
parity: EVEN
stop_bits: 2
- id: uart_2
tx_pin: 7
rx_pin: 8
flow_control_pin: 9
baud_rate: 9600
data_bits: 8
rx_buffer_size: 512
rx_full_threshold: 10
rx_timeout: 1
parity: EVEN
stop_bits: 2
- id: uart_3
tx_pin: 10
rx_pin: 11
flow_control_pin: 12
baud_rate: 9600
data_bits: 8
rx_buffer_size: 512
rx_full_threshold: 10
rx_timeout: 1
parity: EVEN
stop_bits: 2